中国科学院重庆绿色智能技术研究院机构知识库

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限定条件	作者：杜春雷    第一作者    发表日期：2016

已选(0)清除 条数/页：5101520253035404550556065707580859095100   排序方式：请选择期刊影响因子升序期刊影响因子降序作者升序作者降序题名升序题名降序WOS被引频次升序WOS被引频次降序发表日期升序发表日期降序提交时间升序提交时间降序
	A stably enhanced transparent conductive graphene film obtained using an air-annealing method 期刊论文 MATERIALS RESEARCH EXPRESS, 2016, 卷号: 3, 期号: 8, 页码: 7 作者:  Song, Xuefen;  Wei, Dapeng;  Sun, Tai;  Yu, Leyong;  Yang, Jun;  Zhang, Yongna;  Fang, Liang;  Wei, Dacheng;  Shi, Haofei;  Du, Chunlei Adobe PDF(2273Kb)  |  收藏  |  浏览/下载：147/0  |  提交时间：2018/03/15 pristine graphene  transparent conductive property  air-annealing method  stability
	High-efficiency, stable and non-chemically doped graphene-Si solar cells through interface engineering and PMMA antireflection 期刊论文 RSC ADVANCES, 2016, 卷号: 6, 期号: 12, 页码: 10175-10179 作者:  Jiao, Tianpeng;  Wei, Dapeng;  Song, Xuefen;  Sun, Tai;  Yang, Jun;  Yu, Leyong;  Feng, Yanhui;  Sun, Wentao;  Wei, Wei;  Shi, Haofei;  Hu, Chenguo;  Du, Chunlei Adobe PDF(596Kb)  |  收藏  |  浏览/下载：107/0  |  提交时间：2018/03/15
	Terahertz amplitude modulator with graphene based metasurface 会议论文 6th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, IEEE 3M-NANO 2016, Chongqing, China, July 18, 2016 - July 22, 2016 作者:  Zhang, Xin;  Xia, Liangping;  Zhang, Ziyin;  Zhang, Xinqun;  Wei, Dongshan;  Nie, Changbin;  Cui, Hongliang;  Du, Chunlei Adobe PDF(636Kb)  |  收藏  |  浏览/下载：119/0  |  提交时间：2018/03/16
	Fabricating fresnel mirrors imaged in visible light region by ultra precision manufacturing technology 会议论文 6th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, IEEE 3M-NANO 2016, Chongqing, China, July 18, 2016 - July 22, 2016 作者:  Zhang, Weiguo;  Liu, Fenglei;  Zhu, Guodong;  Wang, Deqiang;  Xiong, Xin;  Du, Chunlei Adobe PDF(323Kb)  |  收藏  |  浏览/下载：110/0  |  提交时间：2018/03/16
	Sheet conductance and imaging of graphene by terahertz time-domain spectroscopy 会议论文 6th IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale, IEEE 3M-NANO 2016, Chongqing, China, July 18, 2016 - July 22, 2016 作者:  Yan, Shihan;  Li, Zhancheng;  Wei, Dongshan;  Cui, Hong-Liang;  Du, Chunlei Adobe PDF(529Kb)  |  收藏  |  浏览/下载：73/0  |  提交时间：2018/03/16