中国科学院重庆绿色智能技术研究院机构知识库

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	Contributed Review: Instruments for measuring Seebeck coefficient of thin film thermoelectric materials: A mini-review
	Wang, Chen1; Chen, Fenggui2; Sun, Kuan1; Chen, Rui1; Li, Meng1; Zhou, Xiaoyuan1,3; Sun, Yuyang4; Chen, Dongyang5; Wang, Guoyu6
	2018-10-01
摘要	Thin film thermoelectric materials (TF TEMs) based on organic semiconductors or organic/inorganic composites exhibit unique properties such as low-temperature processability, mechanical flexibility, great freedom of material design, etc. Thus they have attracted a growing research interest. Similar to inorganic bulk thermoelectric materials (IB TEMs), the Seebeck coefficient combined with electrical conductivity and thermal conductivity is a fundamental property to influence the performance of TF TEMs. However, due to the differences in material and sample geometries, the well-established characterization devices for IB TEMs are no longer applicable to TF TEMs. And until now, a universal standard of measuring the Seebeck coefficient of TF TEMs is still lacking. This mini-review presents the development of instruments designed for measuring the Seebeck coefficient of TF TEMs in the last decade. Primary measurement methods and typical apparatus designs will be reviewed, followed by an error analysis induced by instrumentation. Hopefully this mini-review will facilitate better designs for a more accurate characterization of the Seebeck coefficient of thin film thermoelectric materials. Published by AIP Publishing.
DOI	10.1063/1.5038406
发表期刊	REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN	0034-6748
卷号	89期号:10页码:9
收录类别	SCI
WOS记录号	WOS:000449144500263
语种	英语