KMS Chongqing Institute of Green and Intelligent Technology, CAS
| Lateral Force Calibration in Atomic Force Microscopy: Minireview | |
Wang, Huabin
| |
| 2017 | |
| 摘要 | Atomic force microscopy (AFM) is widely used in nanotribology for obtaining information on molecular level frictional properties of surfaces. In practice these properties are difficult to determine accurately since they rely on a number of parameters that are either unknown or difficult to measure. Amongst these is the lateral force response of the AFM cantilever. The lateral force response is key to measuring friction properties of surfaces, yet remains a technological challenge to determine accurately for proponents of AFM and methods for calibrating the lateral force response of an AFM cantilever continue to be developed. In the present paper we overview what currently are the more popular methods for lateral force calibration; describing, comparing and critiquing their methodologies. |
| DOI | 10.1166/sam.2017.2738 |
| 发表期刊 | SCIENCE OF ADVANCED MATERIALS
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| ISSN | 1947-2935 |
| 卷号 | 9期号:1页码:56-64 |
| 通讯作者 | Wang, HB (reprint author), Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multi Scale Mfg Technol, Beijing 400714, Peoples R China. ; Wang, HB (reprint author), Univ Melbourne, Sch Chem, Melbourne, Vic 3010, Australia. |
| 收录类别 | SCI |
| WOS记录号 | WOS:000396469000012 |
| 语种 | 英语 |
