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	Toroidal silicon polarization analyzer for resonant inelastic x-ray scattering
	Gao, Xuan1,2; Casa, Diego3; Kim, Jungho3; Gog, Thomas3; Li, Chengyang1,4; Burns, Clement1
	2016-08-01
摘要	Resonant Inelastic X-ray Scattering (RIXS) is a powerful probe for studying electronic excitations in materials. Standard high energy RIXS measurements do not measure the polarization of the scattered x-rays, which is unfortunate since it carries information about the nature and symmetry of the excitations involved in the scattering process. Here we report the fabrication of thin Si-based polarization analyzers with a double-concave toroidal surface, useful for L-edge RIXS studies in heavier atoms such as the 5-d transition metals. Published by AIP Publishing.
DOI	10.1063/1.4959566
发表期刊	REVIEW OF SCIENTIFIC INSTRUMENTS
ISSN	0034-6748
卷号	87期号:8页码:7
通讯作者	Gao, X (reprint author), Western Michigan Univ, Dept Phys, Kalamazoo, MI 49008 USA. ; Gao, X (reprint author), Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China.
收录类别	SCI
WOS记录号	WOS:000383880100007
语种	英语