KMS Chongqing Institute of Green and Intelligent Technology, CAS
| Enhancement Effects of the Terahertz Near-Field Microscopy | |
Huang, Jian1; Yang, Zhongbo1 ; Wei, Dongshan1 ; Du, Chunlei1; Cui, Hong-Liang1,2
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| 2015-12-01 | |
| 摘要 | Terahertz near-field detection based and imaging on a nanotip has drawn wide attention following extensive applications of terahertz imaging technologies. Through the local enhanced electric field created by a terahertz nanotip in the near field, it is very likely to attain superior detection sensitivity and higher spatial resolution. This paper simulates the local enhancement effects of the terahertz near-field microscopy using a two-dimension finite difference time domain (2D-FDTD) method. Factors that influence the enhancement effects are investigated and analyzed in detail. Simulation results show that the size of the nanotip apex, the apex-substrate distance, dielectric properties of the substrate and the detected sample, etc., have significant impacts on the electric field enhancement and spatial resolution of the terahertz near-field nanotip, which can be explained from the effective polarizability of the nanotip-sample/substrate system. |
| 关键词 | terahertz nanotip finite difference time domain enhancement effect effective polarizability dielectric constant |
| DOI | 10.3390/app5041745 |
| URL | 查看原文 |
| 发表期刊 | APPLIED SCIENCES-BASEL
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| ISSN | 2076-3417 |
| 卷号 | 5期号:4页码:1745-1755 |
| 通讯作者 | Wei, DS (reprint author), Chinese Acad Sci, Chongqing Inst Green & Intelligent Technol, Chongqing Key Lab Multiscale Mfg Technol, Chongqing 400714, Peoples R China. |
| 收录类别 | SCI |
| WOS记录号 | WOS:000367529300068 |
| 语种 | 英语 |
