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Terahertz detection of thin defects thickness based on Hilbert transform and power spectrum estimation
Wang Jie1; Tan Bing-Chong1; Tao Xing-Zhu1; Xu Cheng-Cheng1; Chang Tian-Ying1; Cui Hong-Liang1,2; Zhang Jin1
2022-06-01
摘要A spectral analysis algorithm based on the combination of Hilbert transform(HT)and power spectrum estimation has been proposed,and the terahertz reflection time domain waveform was processed. At the same time,the algorithm was applied to terahertz time domain spectroscopy imaging,defect thickness was correlated with image gray level,and the thickness,position and shape of defects in glass fiber laminate can be detected by imaging simultaneously. The experimental results show that when the multi-signal classification(MUSIC)spectrum estimation and auto regressive(AR)spectrum estimation are combined with Hilbert transform,the reflected pulses between upper and lower surfaces of defect with thickness of 0. 08 mm can be successfully distinguished,the time resolution of reflected pulses is higher than 0. 5 ps,and the detection error of defect thickness is no more than 0. 03 mm.
关键词terahertz time domain spectroscopy thickness estimation Hilbert transform power spectrum estimation glass fiber laminate
DOI10.11972/j.issn.1001-9014.2022.03.010
发表期刊JOURNAL OF INFRARED AND MILLIMETER WAVES
ISSN1001-9014
卷号41期号:3页码:589-596
通讯作者Wang Jie(wangjie16831@163.com) ; Zhang Jin(zhangjin0109@jlu.edu.cn)
收录类别SCI
WOS记录号WOS:000833515400010
语种英语